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[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - Extraction of the coupling coefficients for the top-floating-gate (TFG) flash EEPROM cell

✍ Scribed by McCarthy, D.; O'Shea, M.; Duane, R.; Mccarthy, K.; Concannon, A.; Mathewson, A.

Book ID: 126690546
Publisher: IEEE
Year: 2002
Weight: 226 KB
Category: Article
ISBN-13: 9780780374645
DOI: 10.1109/ICMTS.2002.1193186

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