𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - Test structure for precise statistical characteristics measurement of MOSFETs

✍ Scribed by Shimizu, Y.; Nakamura, M.; Matsuoka, T.; Taniguchi, K.

Book ID: 121389588
Publisher: IEEE
Year: 2002
Weight: 386 KB
Category: Article
ISBN-13: 9780780374645
DOI: 10.1109/ICMTS.2002.1193170

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE ICMTS 2002. 2002 International Con

[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - A comparison of extraction techniques for threshold voltage mismatch

✍ Croon, J.A.; Tuinhout, H.P.; Difrenza, R.; Knol, J.; Moonen, A.J.; Decoutere, S. 📂 Article 📅 2002 🏛 IEEE ⚖ 448 KB

[IEEE ICMTS 2002. 2002 International Con

[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - Comparison between matching parameters and fluctuations at the wafer level

✍ Difrenza, R.; Llinares, P.; Taupin, S.; Palla, R.; Garnier, C.; Ghibaudo, G. 📂 Article 📅 2002 🏛 IEEE ⚖ 281 KB

[IEEE ICMTS 2002. 2002 International Con

[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - Extraction of the coupling coefficients for the top-floating-gate (TFG) flash EEPROM cell

✍ McCarthy, D.; O'Shea, M.; Duane, R.; Mccarthy, K.; Concannon, A.; Mathewson, A. 📂 Article 📅 2002 🏛 IEEE ⚖ 226 KB

[IEEE ICMTS 2002. 2002 International Con

[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - A combined R/sub G//C/sub F/ large-signal extraction methodology to improve CMOS SPICE-parameter precision

✍ Mecking, S.; Korbel, A.; Paparisto, E.; Langmann, U. 📂 Article 📅 2002 🏛 IEEE ⚖ 297 KB

[IEEE ICMTS 2002. 2003 International Con

[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Test time reduction methods for yield test structures

✍ Hess, C.; Read, H.; Ren, J.; Weiland, L.H.; Jianjun Cheng, ; Chock Gan, ; Karbas 📂 Article 📅 2003 🏛 IEEE ⚖ 394 KB

[IEEE ICMTS 2002. 2003 International Con

[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - A test circuit for measuring MOSFET threshold voltage mismatch

✍ Terada, K.; Eimitsu, M. 📂 Article 📅 2003 🏛 IEEE ⚖ 256 KB