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[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - Comparison between matching parameters and fluctuations at the wafer level

✍ Scribed by Difrenza, R.; Llinares, P.; Taupin, S.; Palla, R.; Garnier, C.; Ghibaudo, G.

Book ID: 121389589
Publisher: IEEE
Year: 2002
Weight: 281 KB
Category: Article
ISBN-13: 9780780374645
DOI: 10.1109/ICMTS.2002.1193203

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