𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Polysilicon resistive heated scribe lane test structure for productive wafer level reliability monitoring of NBTI

✍ Scribed by Muth, W.; Martin, A.; von Hagen, J.; Smeets, D.; Fazekas, J.

Book ID: 126723942
Publisher: IEEE
Year: 2003
Weight: 369 KB
Category: Article
ISBN-13: 9780780376533
DOI: 10.1109/ICMTS.2003.1197440

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE ICMTS 2002. 2003 International Con

[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Test time reduction methods for yield test structures

✍ Hess, C.; Read, H.; Ren, J.; Weiland, L.H.; Jianjun Cheng, ; Chock Gan, ; Karbas 📂 Article 📅 2003 🏛 IEEE ⚖ 394 KB

[IEEE ICMTS 2002. 2003 International Con

[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Substrate resistance modeling for noise coupling analysis

✍ Kristiansson, S.; Kagganti, S.P.; Ewert, T.; Ingvarson, F.; Olsson, J.; Jeppson, 📂 Article 📅 2003 🏛 IEEE ⚖ 395 KB

[IEEE ICMTS 2002. 2003 International Con

[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - A test circuit for measuring MOSFET threshold voltage mismatch

✍ Terada, K.; Eimitsu, M. 📂 Article 📅 2003 🏛 IEEE ⚖ 256 KB

[IEEE ICMTS 2002. 2003 International Con

[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Test structure design considerations for RF-CV measurements on leaky dielectrics

✍ Schmitz, J.; Cubaynes, F.N.; Havens, R.J.; de Kort, R.; Scholten, A.J.; Tiemeije 📂 Article 📅 2003 🏛 IEEE ⚖ 332 KB

[IEEE ICMTS 2002. Proceedings of the 200

[IEEE ICMTS 2002. Proceedings of the 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (2003.03.17-2003.03.20)] International Conference on Microelectronic Test Structures, 2003. - An advanced defect-monitoring test structure for electrical measurements and defect localization

✍ Hamamura, Y.; Kumazawa, T.; Tsunokuni, K.; Sugimoto, A.; Asakura, H. 📂 Article 📅 2003 🏛 IEEE ⚖ 413 KB

[IEEE ICMTS 2002. 2003 International Con

[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Characterization and modeling of MOSFET mismatch of a deep submicron technology

✍ Quarantelli, M.; Saxena, S.; Dragone, N.; Babcock, J.A.; Hess, C.; Minehane, S.; 📂 Article 📅 2003 🏛 IEEE ⚖ 379 KB