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[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Characterization and modeling of MOSFET mismatch of a deep submicron technology

✍ Scribed by Quarantelli, M.; Saxena, S.; Dragone, N.; Babcock, J.A.; Hess, C.; Minehane, S.; Winters, S.; Jianjun Chen, ; Karbasi, H.; Guardiani, C.

Book ID: 126187441
Publisher: IEEE
Year: 2003
Weight: 379 KB
Category: Article
ISBN-13: 9780780376533
DOI: 10.1109/ICMTS.2003.1197468

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