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[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Substrate resistance modeling for noise coupling analysis

✍ Scribed by Kristiansson, S.; Kagganti, S.P.; Ewert, T.; Ingvarson, F.; Olsson, J.; Jeppson, K.O.

Book ID: 120632568
Publisher: IEEE
Year: 2003
Weight: 395 KB
Category: Article
ISBN-13: 9780780376533
DOI: 10.1109/ICMTS.2003.1197429

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