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[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - BSIM3 RF models for MOS transistors: a novel technique for substrate network extraction

✍ Scribed by Rustagi, S.C.; Huailin Liao, ; Jinglin Shi, ; Yong Zhong Xiong,

Book ID: 117996617
Publisher: IEEE
Year: 2003
Weight: 345 KB
Volume: 0
Category: Article
ISBN-13: 9780780376533
DOI: 10.1109/icmts.2003.1197427

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