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[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Test time reduction methods for yield test structures

✍ Scribed by Hess, C.; Read, H.; Ren, J.; Weiland, L.H.; Jianjun Cheng, ; Chock Gan, ; Karbasi, H.; Winters, S.

Book ID: 126725483
Publisher: IEEE
Year: 2003
Weight: 394 KB
Category: Article
ISBN-13: 9780780376533
DOI: 10.1109/ICMTS.2003.1197384

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