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[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - A combined R/sub G//C/sub F/ large-signal extraction methodology to improve CMOS SPICE-parameter precision

✍ Scribed by Mecking, S.; Korbel, A.; Paparisto, E.; Langmann, U.

Book ID: 120826207
Publisher: IEEE
Year: 2002
Weight: 297 KB
Category: Article
ISBN-13: 9780780374645
DOI: 10.1109/ICMTS.2002.1193181

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