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[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - A comparison of extraction techniques for threshold voltage mismatch

✍ Scribed by Croon, J.A.; Tuinhout, H.P.; Difrenza, R.; Knol, J.; Moonen, A.J.; Decoutere, S.; Maes, H.E.; Sansen, W.

Book ID: 118164828
Publisher: IEEE
Year: 2002
Weight: 448 KB
Volume: 0
Category: Article
ISBN-13: 9780780374645
DOI: 10.1109/icmts.2002.1193202

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