𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - Extraction of the channel thermal noise in MOSFETs

✍ Scribed by Chih-Hung Chen, ; Deen, M.J.; Matloubian, M.; Yuhua Cheng,

Book ID: 126767401
Publisher: IEEE
Year: 2000
Weight: 343 KB
Category: Article
DOI: 10.1109/ICMTS.2000.844403

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE ICMTS 2000. Proceedings of the 200

[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - Characterisation of systematic MOSFET transconductance mismatch

✍ Tuinhout, H. 📂 Article 📅 2000 🏛 IEEE ⚖ 580 KB

[IEEE ICMTS 2000. Proceedings of the 200

[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - New method for parameter extraction in deep submicrometer MOSFETs

✍ Mourrain, C.; Cretu, B.; Ghibaudo, G.; Cottin, P. 📂 Article 📅 2000 🏛 IEEE ⚖ 289 KB

[IEEE ICMTS 2000. Proceedings of the 200

[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - Physically-based effective width modeling of MOSFETs and diffused resistors

✍ McAndrew, C.C.; Sekine, S.; Cassagnes, A.; Zhicheng Wu, 📂 Article 📅 2000 🏛 IEEE ⚖ 383 KB

[IEEE ICMTS 2000. Proceedings of the 200

[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - A microelectronic test structure for signal integrity characterization in deep submicron technology

✍ Caignet, F.; Dhia, S.D.-B.; Sicard, E. 📂 Article 📅 2000 🏛 IEEE ⚖ 360 KB

[IEEE ICMTS 2000. Proceedings of the 200

[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - A study on hot-carrier-induced photoemission in n-MOSFETs under dynamic operation

✍ Ohzone, T.; Yuzaki, M.; Matsuda, T.; Kameda, E. 📂 Article 📅 2000 🏛 IEEE ⚖ 453 KB

[IEEE ICMTS 2000. Proceedings of the 200

[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - A novel approach for precise characterization of long distance mismatch of CMOS-devices

✍ Schaper, U.; Linnenbank, C.; Thewes, R. 📂 Article 📅 2000 🏛 IEEE ⚖ 270 KB