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[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - New method for parameter extraction in deep submicrometer MOSFETs

✍ Scribed by Mourrain, C.; Cretu, B.; Ghibaudo, G.; Cottin, P.

Book ID: 125535514
Publisher: IEEE
Year: 2000
Weight: 289 KB
Category: Article
DOI: 10.1109/ICMTS.2000.844428

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