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[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - A microelectronic test structure for signal integrity characterization in deep submicron technology

✍ Scribed by Caignet, F.; Dhia, S.D.-B.; Sicard, E.

Book ID: 126729777
Publisher: IEEE
Year: 2000
Weight: 360 KB
Category: Article
DOI: 10.1109/ICMTS.2000.844407

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