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[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - Characterisation of systematic MOSFET transconductance mismatch

✍ Scribed by Tuinhout, H.

Book ID: 126734309
Publisher: IEEE
Year: 2000
Weight: 580 KB
Category: Article
DOI: 10.1109/ICMTS.2000.844419

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