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[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - A study on hot-carrier-induced photoemission in n-MOSFETs under dynamic operation

✍ Scribed by Ohzone, T.; Yuzaki, M.; Matsuda, T.; Kameda, E.

Book ID: 126604311
Publisher: IEEE
Year: 2000
Weight: 453 KB
Category: Article
DOI: 10.1109/ICMTS.2000.844408

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