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[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - A new extraction method of retention time from the leakage current in 0.23 μm DRAM memory cell

✍ Scribed by Choong-Mo Nam, ; Sung-Kye Park, ; Sang-Ho Lee, ; Jai-Bum Suh, ; Gyu-Han Yoon, ; Sung-Ho Jang,

Book ID: 126664429
Publisher: IEEE
Year: 2000
Weight: 179 KB
Category: Article
DOI: 10.1109/ICMTS.2000.844414

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