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[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - New method for monitoring of analogue processes-evaluation of the impact of metalisation on the performance of precise analogue resistors

✍ Scribed by Pergoot, A.; Cox, P.; Vercruysse, P.; Wuyts, I.; Raes, P.

Book ID: 127347393
Publisher: IEEE
Year: 1998
Weight: 310 KB
Category: Article
ISBN-13: 9780780343481
DOI: 10.1109/icmts.1998.688026

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