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[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Parametric counterfeit IC detection via Support Vector Machines

✍ Scribed by Huang, Ke; Carulli, John M; Makris, Yiorgos

Book ID: 126745697
Publisher: IEEE
Year: 2012
Weight: 266 KB
Category: Article
ISBN: 1467330426
DOI: 10.1109/DFT.2012.6378191

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