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[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Designing and implementing a Malicious 8051 processor

✍ Scribed by Santos, Juan Carlos Martinez; Fei, Yunsi

Book ID: 118169232
Publisher: IEEE
Year: 2012
Weight: 285 KB
Category: Article
ISBN: 1467330426
DOI: 10.1109/dft.2012.6378201

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