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[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Software exploitable hardware Trojans in embedded processor

✍ Scribed by Wang, Xinmu; Mal-Sarkar, Tatini; Krishna, Aswin; Narasimhan, Seetharam; Bhunia, Swarup

Book ID: 120997074
Publisher: IEEE
Year: 2012
Weight: 482 KB
Category: Article
ISBN: 1467330426
DOI: 10.1109/DFT.2012.6378199

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