𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Accurate calculation of SET propagation probability for hardening

✍ Scribed by Gangadhar, Sreenivas; Tragoudas, Spyros

Book ID: 126708499
Publisher: IEEE
Year: 2012
Weight: 219 KB
Category: Article
ISBN: 1467330426
DOI: 10.1109/DFT.2012.6378208

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2012 IEEE International Symposium

[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Fast single-FPGA fault injection platform

✍ Nazar, Gabriel L.; Carro, Luigi 📂 Article 📅 2012 🏛 IEEE ⚖ 569 KB

[IEEE 2012 IEEE International Symposium

[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Designing and implementing a Malicious 8051 processor

✍ Santos, Juan Carlos Martinez; Fei, Yunsi 📂 Article 📅 2012 🏛 IEEE ⚖ 285 KB

[IEEE 2012 IEEE International Symposium

[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Software exploitable hardware Trojans in embedded processor

✍ Wang, Xinmu; Mal-Sarkar, Tatini; Krishna, Aswin; Narasimhan, Seetharam; Bhunia, 📂 Article 📅 2012 🏛 IEEE ⚖ 482 KB

[IEEE 2012 IEEE International Symposium

[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Path-delay fingerprinting for identification of recovered ICs

✍ Zhang, Xuehui; Xiao, Kan; Tehranipoor, Mohammad 📂 Article 📅 2012 🏛 IEEE ⚖ 490 KB

[IEEE 2012 IEEE International Symposium

[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Parametric counterfeit IC detection via Support Vector Machines

✍ Huang, Ke; Carulli, John M; Makris, Yiorgos 📂 Article 📅 2012 🏛 IEEE ⚖ 266 KB

[IEEE 2012 IEEE International Symposium

[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Dependable routing in multi-chip NoC platforms for automotive applications

✍ Yoneda, Tomohiro; Imai, Masashi 📂 Article 📅 2012 🏛 IEEE ⚖ 289 KB