𝔖 Bobbio Scriptorium

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[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Dependable routing in multi-chip NoC platforms for automotive applications

✍ Scribed by Yoneda, Tomohiro; Imai, Masashi

Book ID: 120837010
Publisher: IEEE
Year: 2012
Weight: 289 KB
Category: Article
ISBN: 1467330426
DOI: 10.1109/DFT.2012.6378227

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