𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Fast single-FPGA fault injection platform

✍ Scribed by Nazar, Gabriel L.; Carro, Luigi

Book ID: 118244890
Publisher: IEEE
Year: 2012
Weight: 569 KB
Category: Article
ISBN: 1467330426
DOI: 10.1109/dft.2012.6378216

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