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[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - A Practical Approach to Single Event Transients Analysis for Highly Complex Designs

✍ Scribed by Alexandrescu, Dan; Costenaro, Enrico; Nicolaidis, Michael

Book ID: 115527015
Publisher: IEEE
Year: 2011
Weight: 286 KB
Volume: 0
Category: Article
ISBN: 1457717131
DOI: 10.1109/dft.2011.18

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