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[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - On the Delay Analysis of Defective CNTFETs with Undeposited CNTs

โœ Scribed by Cho, Geunho; Lombardi, Fabrizio


Book ID
120266778
Publisher
IEEE
Year
2011
Weight
402 KB
Category
Article
ISBN
1457717131

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