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[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - Impact of Aging Phenomena on Soft Error Susceptibility

✍ Scribed by Rossi, Daniele; Omaña, Martin; Metra, Cecilia; Paccagnella, Alessandro

Book ID: 121323721
Publisher: IEEE
Year: 2011
Weight: 775 KB
Category: Article
ISBN: 1457717131
DOI: 10.1109/DFT.2011.45

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