𝔖 Bobbio Scriptorium

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[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - Impact of Synthesis Constraints on Error Propagation Probability of Digital Circuits

✍ Scribed by Limbrick, Daniel B.; Yue, Suge; Robinson, William H.; Bhuva, Bharat L.

Book ID: 115525582
Publisher: IEEE
Year: 2011
Weight: 345 KB
Volume: 0
Category: Article
ISBN: 1457717131
DOI: 10.1109/dft.2011.46

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