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[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Path-delay fingerprinting for identification of recovered ICs

✍ Scribed by Zhang, Xuehui; Xiao, Kan; Tehranipoor, Mohammad

Book ID: 121699910
Publisher: IEEE
Year: 2012
Weight: 490 KB
Category: Article
ISBN: 1467330426
DOI: 10.1109/dft.2012.6378192

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