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[IEEE 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2012.05.29-2012.06.1)] 2012 IEEE 62nd Electronic Components and Technology Conference - Impact of the winding area of enameled wire on packaging performance of a closed loop Hall effect current sensor

✍ Scribed by Li, Fuan; Luo, Xiaobing; Cheng, Xingguo; Liu, Sheng

Book ID: 118219003
Publisher: IEEE
Year: 2012
Weight: 981 KB
Category: Article
ISBN: 1467319643
DOI: 10.1109/ectc.2012.6249055

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