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[IEEE 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2012.05.29-2012.06.1)] 2012 IEEE 62nd Electronic Components and Technology Conference - The process and reliability tests of glass-to-glass laser bonding for top-emission OLED device

✍ Scribed by Lai, Yuneng; Chen, Zunmiao; Huang, Yuanhao; Zhang, Jianhua

Book ID: 115443681
Publisher: IEEE
Year: 2012
Weight: 911 KB
Category: Article
ISBN: 1467319643
DOI: 10.1109/ectc.2012.6249120

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