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[IEEE 2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - Taipei, Taiwan (2011.10.19-2011.10.21)] 2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - Nonlinear thermal stress analyses and design guidelines for through silicon vias (TSVs) in 3D IC integration

โœ Scribed by Hsieh, Ming-Che; Wu, Sheng-Tsai; Li, Wei; Tain, Ra-Min; Lau, John H.; Lo, Robert; Kao, Ming-Jer


Book ID
120011427
Publisher
IEEE
Year
2011
Weight
955 KB
Category
Article
ISBN
1457713888

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