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[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Operational amplifier based test structure for transistor threshold voltage variation

✍ Scribed by Ji, Brian L.; Pearson, Dale J.; Lauer, Isaac; Stellari, Franco; Frank, David J.; Chang, Leland; Ketchen, Mark B.

Book ID: 126748960
Publisher: IEEE
Year: 2008
Weight: 620 KB
Category: Article
ISBN: 1424418011
DOI: 10.1109/ICMTS.2008.4509305

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