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[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Mismatch characterization of a high precision resistor array test structure

✍ Scribed by Weidong Tian, ; Steinmann, Philipp; Beach, Eric; Khan, Imran; Madhani, Praful

Book ID: 118164829
Publisher: IEEE
Year: 2008
Weight: 261 KB
Volume: 0
Category: Article
ISBN: 1424418011
DOI: 10.1109/icmts.2008.4509307

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