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[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - A test structure for statistical evaluation of pn junction leakage current based on CMOS image sensor technology

✍ Scribed by Abe, Kenichi; Fujisawa, Takafumi; Suzuki, Hiroyoshi; Watabe, Shunichi; Kuroda, Rihito; Sugawa, Shigetoshi; Teramoto, Akinobu; Ohmi, Tadahiro

Book ID: 115450875
Publisher: IEEE
Year: 2010
Weight: 221 KB
Volume: 0
Category: Article
ISBN: 1424469120
DOI: 10.1109/icmts.2010.5466868

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