𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Evaluation of MOSFET C-V curve variation using test structure for charge-based capacitance measurement

✍ Scribed by Tsuji, Katsuhiro; Terada, Kazuo; Kikuchi, Ryota; Tsunomura, Takaaki; Nishida, Akio; Mogami, Tohru

Book ID: 118008189
Publisher: IEEE
Year: 2011
Weight: 376 KB
Volume: 0
Category: Article
ISBN: 1424485266
DOI: 10.1109/icmts.2011.5976852

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2011 International Conference on M

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Contact resistance measurement structures for high frequencies

✍ Roy, Deepu; Pijper, Ralf M. T.; Tiemeijer, Luuk F.; Wolters, Rob A. M. 📂 Article 📅 2011 🏛 IEEE ⚖ 471 KB

[IEEE 2011 International Conference on M

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Matching characteristics of metal resistors

✍ Namba, Hiroaki; Hashimoto, Takasuke; Hayashi, Kenji; Furumiya, Masayuki 📂 Article 📅 2011 🏛 IEEE ⚖ 435 KB

[IEEE 2011 International Conference on M

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Electrical estimation of channel dopant uniformity using test MOSFET array

✍ Terada, Kazuo; Sanai, Kazuhiko; Tsuji, Katsuhiro; Tsunomura, Takaaki; Nishida, A 📂 Article 📅 2011 🏛 IEEE ⚖ 311 KB

[IEEE 2011 International Conference on M

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Improved parameter extraction procedures for the R3 model

✍ McAndrew, Colin C.; Bettinger, Tamara 📂 Article 📅 2011 🏛 IEEE ⚖ 333 KB

[IEEE 2011 International Conference on M

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - A versatile defectivity monitor designed for efficient test and failure analysis

✍ Lauderdale, Matt; Smith, Brad 📂 Article 📅 2011 🏛 IEEE ⚖ 284 KB

[IEEE 2011 International Conference on M

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Lateral bipolar structures for evaluating the effectiveness of surface doping techniques

✍ Lorito, Gianpaolo; Qi, Lin; Nanver, L. K. 📂 Article 📅 2011 🏛 IEEE ⚖ 406 KB