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[IEEE ICMTS 93 1993 International Conference on Microelectronic Test Structures - Sitges, Spain (22-25 March 1993)] ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures - Latch-up test structures for reliability analysis of a floating well based smart power technology

✍ Scribed by Puig Vidal, M.; Bafleur, M.; Buxo, J.; Sarrabayrouse, G.

Book ID: 118162480
Publisher: IEEE
Year: 1992
Weight: 281 KB
Volume: 0
Category: Article
ISBN-13: 9780780308572
DOI: 10.1109/icmts.1993.292885

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