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[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Combined test structure for systematic and stochastic mosfets and gate resistance process variation assessment

✍ Scribed by Bortesi, L.; Vendrame, L.; Fontana, G.

Book ID: 118155234
Publisher: IEEE
Year: 2010
Weight: 282 KB
Volume: 0
Category: Article
ISBN: 1424469120
DOI: 10.1109/icmts.2010.5466810

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