[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Physics and modeling of transistor matching degradation under matched external stress

✍ Scribed by Xiaoju Wu, ; Zhenwu Chen, ; Madhani, Praful

• Book ID: 118167814
• Publisher: IEEE
• Year: 2008
• Weight: 243 KB
• Volume: 0
• Category: Article
• ISBN: 1424418011
• DOI: 10.1109/icmts.2008.4509344