𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Comparison of measurement techniques for advanced photomask metrology

✍ Scribed by Smith, S.; Tsiamis, A.; McCallum, M.; Hourd, A. C.; Stevenson, J. T. M.; Walton, A. J.; Dixson, R. G.; Allen, R. A.; Potzick, J. E.; Cresswell, M. W.; Orji, N. G.

Book ID: 126607319
Publisher: IEEE
Year: 2008
Weight: 172 KB
Category: Article
ISBN: 1424418011
DOI: 10.1109/ICMTS.2008.4509311

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2008 IEEE International Conference

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Mixed test structure for soft and hard defect detection

✍ Rigaud, F.; Portal, J. M.; Aziza, H.; Nee, D.; Vast, J.; Argoud, F.; Borot, B. 📂 Article 📅 2008 🏛 IEEE ⚖ 350 KB

[IEEE 2008 IEEE International Conference

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Operational amplifier based test structure for transistor threshold voltage variation

✍ Ji, Brian L.; Pearson, Dale J.; Lauer, Isaac; Stellari, Franco; Frank, David J.; 📂 Article 📅 2008 🏛 IEEE ⚖ 620 KB

[IEEE 2008 IEEE International Conference

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Mismatch characterization of a high precision resistor array test structure

✍ Weidong Tian, ; Steinmann, Philipp; Beach, Eric; Khan, Imran; Madhani, Praful 📂 Article 📅 2008 🏛 IEEE ⚖ 261 KB

[IEEE 2008 IEEE International Conference

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Test structures for the evaluation of 3D chip interconnection schemes

✍ Mathewson, A.; Brun, J.; Franiatte, R.; Nowodzinski, A.; Ancient, R.; Sillon, N. 📂 Article 📅 2008 🏛 IEEE ⚖ 938 KB

[IEEE 2008 IEEE International Conference

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - On-mask mismatch resistor structures for the characterisation of maskmaking capability

✍ Smith, S.; Tsiamis, A.; McCallumt, M.; Hourdt, A. C.; Stevenson, J. T. M.; Walto 📂 Article 📅 2008 🏛 IEEE ⚖ 624 KB

[IEEE 2008 IEEE International Conference

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Measurement of the MOSFET drain current variation under high gate voltage

✍ Tetsuo Chagawa, ; Kazuo Terada, ; Jianyu Xiang, ; Katsuhiro Tsuji, ; Takaaki Tsu 📂 Article 📅 2008 🏛 IEEE ⚖ 212 KB