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[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Mixed test structure for soft and hard defect detection

✍ Scribed by Rigaud, F.; Portal, J. M.; Aziza, H.; Nee, D.; Vast, J.; Argoud, F.; Borot, B.

Book ID: 126594058
Publisher: IEEE
Year: 2008
Weight: 350 KB
Category: Article
ISBN: 1424418011
DOI: 10.1109/ICMTS.2008.4509313

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