✦ LIBER ✦

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - A study of cross-bridge kelvin resistor structures for reliable measurement of low contact resistances

✍ Scribed by Stavitskil, N.; Klootwijk, J. H.; van Zeijl, H. W.; Kovalgin, A. Y.; Wolters, R. A. M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2008 IEEE International Conference

✍ Weidong Tian, ; Steinmann, Philipp; Beach, Eric; Khan, Imran; Madhani, Praful 📂 Article 📅 2008 🏛 IEEE ⚖ 261 KB

[IEEE 2008 IEEE International Conference

✍ Smith, S.; Tsiamis, A.; McCallumt, M.; Hourdt, A. C.; Stevenson, J. T. M.; Walto 📂 Article 📅 2008 🏛 IEEE ⚖ 624 KB

[IEEE 2008 IEEE International Conference

✍ Smith, S.; Tsiamis, A.; McCallum, M.; Hourd, A. C.; Stevenson, J. T. M.; Walton, 📂 Article 📅 2008 🏛 IEEE ⚖ 172 KB

[IEEE 2008 IEEE International Conference

✍ Rigaud, F.; Portal, J. M.; Aziza, H.; Nee, D.; Vast, J.; Argoud, F.; Borot, B. 📂 Article 📅 2008 🏛 IEEE ⚖ 350 KB

[IEEE 2008 IEEE International Conference

✍ Ji, Brian L.; Pearson, Dale J.; Lauer, Isaac; Stellari, Franco; Frank, David J.; 📂 Article 📅 2008 🏛 IEEE ⚖ 620 KB

[IEEE 2008 IEEE International Conference

✍ Mathewson, A.; Brun, J.; Franiatte, R.; Nowodzinski, A.; Ancient, R.; Sillon, N. 📂 Article 📅 2008 🏛 IEEE ⚖ 938 KB