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[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - A study of variation in characteristics and subthreshold humps for 65-nm SRAM using newly developed SRAM cell array test structure

✍ Scribed by Mizumura, A.; Suzuki, T.; Arima, T.; Maeda, H.; Ammo, H.

No coin nor oath required. For personal study only.

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