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[IEEE 2006 IEEE International Conference on Microelectronic Test Structures - Austin, TX, USA (2006.03.6-2006.03.9)] 2006 IEEE International Conference on Microelectronic Test Structures - New test structures for extraction of base sheet resistance in BiCMOS technology

✍ Scribed by Raya, C.; Pourchon, F.; Celi, D.; Laurens, M.; Zimmer, T.

Book ID: 118155233
Publisher: IEEE
Year: 2006
Weight: 521 KB
Volume: 0
Category: Article
ISBN-13: 9781424401673
DOI: 10.1109/icmts.2006.1614270

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