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[IEEE International Conference on Microelectronic Test Structures - San Diego, CA, USA (1990.03.5-1990.03.7)] International Conference on Microelectronic Test Structures - Enhanced SPICE MOSFET model for analog applications including parameter extraction schemes

✍ Scribed by Power, J.A.; Lane, W.A.

Book ID: 120826205
Publisher: IEEE
Year: 1990
Weight: 466 KB
Category: Article
DOI: 10.1109/ICMTS.1990.67892

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