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[IEEE 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) - San Diego, CA, USA (2012.03.19-2012.03.22)] 2012 IEEE International Conference on Microelectronic Test Structures - A compact circuit for wafer-level monitoring of operational amplifier high-frequency performance using DC parametric test equipment

✍ Scribed by Sparling, Z. G.; Tyree, Vance C.; Cox, Nathan; Vernier, P. Thomas

No coin nor oath required. For personal study only.

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