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[IEEE 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) - San Diego, CA, USA (2012.03.19-2012.03.22)] 2012 IEEE International Conference on Microelectronic Test Structures - An extended de-embedding method for on-wafer components

✍ Scribed by Yu-Ling Lin, ; Hsiao-Tsung Yen, ; Ho-Hsiang Chen, ; Chewn-Pu Jou, ; Chin-Wei Kuo, ; Min-Che Jeng, ; Fu-Lung Hsuch, ; Chih-Hua Hsiao, ; Guo-Wei Huang,

Book ID: 121368895
Publisher: IEEE
Year: 2012
Weight: 957 KB
Category: Article
ISBN: 1467310298
DOI: 10.1109/ICMTS.2012.6190638

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