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[IEEE 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) - San Diego, CA, USA (2012.03.19-2012.03.22)] 2012 IEEE International Conference on Microelectronic Test Structures - Phase Change Memory advanced electrical characterization for conventional and alternative applications

✍ Scribed by Toffoli, A.; Suri, Manan; Perniola, L.; Persico, A.; Jahan, C.; Nodin, J.F.; Sousa, V.; DeSalvo, B.; Reimbold, G.

Book ID: 121876633
Publisher: IEEE
Year: 2012
Weight: 842 KB
Category: Article
ISBN: 1467310298
DOI: 10.1109/ICMTS.2012.6190618

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