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[IEEE 1989 International Conference on Microelectronic Test Structures - Edinburgh, UK (13-14 March 1989)] Proceedings of the 1989 International Conference on Microelectronic Test Structures - Enhanced MOS parameter extraction and SPICE modelling for mixed analogue and digital circuit simulation

✍ Scribed by Ankele, B.; Holzl, W.; O'Leary, P.

Book ID: 120826204
Publisher: IEEE
Year: 1989
Weight: 530 KB
Edition: 1
Category: Article
ISBN-13: 9780879427146
DOI: 10.1109/ICMTS.1989.39285

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