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[IEEE 1989 International Conference on Microelectronic Test Structures - Edinburgh, UK (13-14 March 1989)] Proceedings of the 1989 International Conference on Microelectronic Test Structures - Thermal conductivity measurements of thin-film silicon dioxide

✍ Scribed by Schafft, H.A.; Suehle, J.S.; Mirel, P.G.A.

Book ID: 120988046
Publisher: IEEE
Year: 1989
Weight: 491 KB
Edition: 1
Category: Article
ISBN-13: 9780879427146
DOI: 10.1109/ICMTS.1989.39295

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