[IEEE ICMTS 92 1992 International Conference on Microelectronic Test Structures - San Diego, CA, USA (16-19 March 1992)] ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures - An analytical strategy for fast extraction of MOS transistor DC parameters applied to the SPICE M)53 and BSIM models

✍ Scribed by Karlsson, P.R.; Jeppson, K.O.

• Book ID: 120035960
• Publisher: IEEE
• Year: 1992
• Weight: 574 KB
• Category: Article
• ISBN-13: 9780780305359
• DOI: 10.1109/ICMTS.1992.185942